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146 results

Conference Proceedings

1. Sub-lOOnm Hybrid Stamp Fabrication by Hot Embossing

Hong, S.H. ; Yang, K.Y. ; Lee, H.

Pub. info.:	Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.462-465, 2006. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	510-511

Conference Proceedings

2. Fabrication of Nano-Sized Gold Dot Array Using Bi-Layer Nano Imprint Lithography

Yang, K.Y. ; Hong, S.H. ; Lee, H. ; Choi, J.W.

Pub. info.:	Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.446-449, 2006. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	510-511

Conference Proceedings

3. I-V CHARACTERISTICS AND INTERFACE PROPERTIES OF Al-Si(P) CONTACTS BY THE KrF EXCIMER LASER INDUCED RECRYSTALLIZATION

Sohn, K. ; Lee, H. ; Hensley, D.A.

Pub. info.:	Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.733-738, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	283

Conference Proceedings

4. PARTICLE ANALYSIS ON EIGHT INCH NOTCHED UNPATFERNED WAFERS

Uritsky, Y. ; Lee, H.

Pub. info.:	Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing III. pp.154-166, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-9

Conference Proceedings

5. Formation of Chromate Conversion Coatings on Aluminum and its Alloys: An in-Situ XANES Study

Sasaki, K. ; Isaacs, H.S. ; Jaffcoate, C.S. ; Buchhait, R. ; Legat, V. ; Lee, H. ; Srinivasamurthi, V.

Pub. info.:	Corrosion and corrosion protection : proceedings of the international symposium. pp.510-518, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-22

Conference Proceedings

6. Characterization of Samples Regrown by Molecular Beam Epitaxy following In Situ Bombardment with Variable-Energy Focused Ion Beams

Bone, D.J. ; Lee, H. ; Williams, K. ; Harris, J.S., Jr. ; Pease, R. F. W.

Pub. info.:	Proceedings of the Symposium on Large Area Wafer Growth and Processing for Electronic and Photonic Devices and the twentieth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XX). pp.295-303, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-18

Conference Proceedings

7. Amorphous Silicon Thin Film Transistor Fabricated with a New Copper Dry Etching Method

Lee, S. ; Kuo, Y. ; Donnely, J.P. ; Tewg, J.-Y. ; Lee, H.

Pub. info.:	Thin Film Transistor Technologies V : proceedings of the International Symposium. pp.34-39, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-31

Conference Proceedings

8. Hydrogen Separation by Two-Bed PSA Process

Yang, J. ; Lee, J. -H. ; Lee, C. -H. ; Lee, H.

Pub. info.:	Progress in zeolite and microporous materials : proceedings of the 11th International Zeolite Conference, Seoul, Korea, August 12-17, 1996. C pp.1883-, 1997. Amsterdam. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	105

Conference Proceedings

9. Analysis of thermal properties of the Dupont photopolymer for the digital holographic security card system

Kim, J. ; Lee, H. ; Kim, N. ; Kim, E. ; Gil, S.

Pub. info.:	Emerging optoelectronic applications : 26-27 January, 2004, San Jose, California, USA. pp.192-199, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5363

10.

Conference Proceedings

10. High Density Plasma Gate Etching of 0.12 um Devices with Sub-1.5 nm Gate Oxides

Klemens, F.P. ; Baumann, F.H. ; Kornblit, A. ; Layadi, N. ; Lee, H. ; Maynard, H.L. ; Mytych, J.M. ; Sorch, T.W. ; Tennant, D.M. ; Timp, G.L. ; Lee, J.T.C.

Pub. info.:	Proceedings of the International Symposium on Thin Film Materials, Processes, Reliability, and Applications, Thin Film Processes. pp.85-95, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-30

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Author: Lee, H.