Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.177-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Chuang, R. W. ; Zou, A. Q. ; Lee, H. P. ; Dong, Z. J. ; Xiong, F. F. ; Shih, R. ; Bremser, M. ; Juergensen, H.
Pub. info.:
GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.. pp.G6.42.1-, 1999. Warrendale, Pa.. MRS - Materials Research Society
Lee, H. P. ; Szalkowski, F. J. ; Zeng, X. ; Wolfenstine, J. ; Ager, J. W., III.
Pub. info.:
Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.. pp.53-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Polarization and color techniques in industrial inspection : 17-18 June 1999, Munich, Germany. pp.185-194, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chung, S. W. ; Zhao, Y. S. ; Lin, C. H. ; Lee, H. P.
Pub. info.:
GaN and related alloys - 2000 : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Lin, C. H. ; Hibbard, D. L. ; Au, A. ; Lee, H. P. ; Dong, Z.J. ; Szalkowski, F. J. ; Chen, J. ; Chen, C.
Pub. info.:
GaN and related alloys - 2000 : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society