1.

Conference Proceedings
Conference Proceedings
1. A new approach to preparation of standard LEDs for luminous intensity and flux measurement of LEDs (Invited Paper) [6355-17]
Park, S.-N. ; Park, S. ; Lee, D.-H.
Pub. info.: Advanced LEDs for solid state lighting : 5-7 September 2006, Gwangju, South Korea.  pp.63550G-,  2006.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6355
2.

Conference Proceedings
Conference Proceedings
2. Formation and Properties of Co-Suicide by Using Col-x Tax Alloy
Kim, M.-J. ; Lee, D.-H. ; Ko, D.-H. ; Ku, J.-H. ; Choi, S. ; Fujihara, K. ; Kang, H.-K. ; Oh, S-H. ; Park, C.-G. ; Lee, H.-J.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.571-580,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-2
3.

Conference Proceedings
Conference Proceedings
3. Nanocrystals Formation and Microstructure Evolution of Amorphous Si and Si0 7Ge0.3 by Using Low Pressure Chemical Vapor Deposition
Yoon, T.-S. ; Lee, D.-H. ; Koon, J.-K. ; Kim, K.B.
Pub. info.: CVD XV, proceedings of the fifteenth International Symposium on Chemical Vapor Deposition.  pp.419-426,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-13
4.

Technical Paper
Technical Paper
4. Multidisciplinary Aerodynamic - Structural Design Optimization of Supersonic Fighter Wing Using Response Surface Methodology.
Kim, Y. ; Kim, J. ; Jeon, Y. ; Bang, J. ; Park, C. ; Lee, D.-H.
Pub. info.: AIAA paper.  2002.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2002
5.

Technical Paper
Technical Paper
5. Effects of the Internal Shape of EGR Cooler on Heat Exchanger Efficiencies.
Park, S.-K. ; Choi, K.-S. ; Wang, H.-M. ; Kim, H.-M. ; Lee, D.-H.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
6.

Technical Paper
Technical Paper
6. Acoustic Nearfield Characteristics of a Premixed Flame in a Longitudinal Acoustic Field.
Lee, D.-H. ; Lieuwen, T.C.
Pub. info.: A.S.M.E. paper.  2001.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2001
7.

Conference Proceedings
Conference Proceedings
7. Characteristics of residues and optical change of HT PSM during stepwise west cleaning and optimization of HT PSM cleaning process
Jeong, W.-G. ; Kim, D.-W. ; Park, C.-M. ; An, K.-W. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.-S. ; Jeong, S.H.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology IX.  pp.597-605,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4754
8.

Conference Proceedings
Conference Proceedings
8. Optimization of align marks and overlay targets in VIA first dual damascene process
Shin, D.-U. ; Jeong, Y.-B. ; Park, J.-L. ; Choi, J.-S. ; Lee, J.-G. ; Lee, D.-H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.415-427,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
9.

Conference Proceedings
Conference Proceedings
9. CD-SEM calibration with TEM to reduce CD measurement error
Jeong, C.-Y. ; Lee, J. ; Park, K.-Y. ; Lee, W.G. ; Lee, D.-H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part Two  pp.747-755,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689
10.

Conference Proceedings
Conference Proceedings
10. Evaluation of EA-PSM opaque repair on 90-nm lithography
Kim, D.-W. ; Lee, J.-K. ; Koo, S.H. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.-S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.484-495,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130