1.

Conference Proceedings

Conference Proceedings
Pundaleva, I. ; Nam, D. ; Han, H. ; Lee, D. ; Han, W.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61520G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
2.

Conference Proceedings

Conference Proceedings
An, J.Y. ; Kwon, Y.J. ; Kim, S.I. ; Lee, D. ; Yoo, Y.C.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.518-521,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
3.

Conference Proceedings

Conference Proceedings
Lee, S.M. ; Kwon, Y.J. ; Lee, D. ; Cho, S.H. ; Hwang, S.K. ; Yoo, Y.C.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.514-517,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
4.

Conference Proceedings

Conference Proceedings
An, J.Y. ; Kwon, Y.J. ; Kim, S.I. ; Lee, D. ; Lee, C. ; Hwang, S.K. ; Yoo, Y.C.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.510-513,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
5.

Conference Proceedings

Conference Proceedings
Kudo, T. ; Lin, G. ; Lee, D. ; Rahman, D. ; Timko, A. ; Mckenzie, D. ; Anyadiegwu, C. ; Chiu, S. ; Houlihan, F. ; Rentkiewicz, D. ; Dammel, R. R. ; Padmanaban, M. ; Biafore, J.
Pub. info.: Advances in Resist Technology and Processing XXIII.  pp.61532C-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6153
6.

Conference Proceedings

Conference Proceedings
Lee, D. ; Kim, Y. S. ; Ra, J. B.
Pub. info.: Medical Imaging 2006: Ultrasonic Imaging and Signal Processing.  pp.614708-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6147
7.

Conference Proceedings

Conference Proceedings
Vilnrotter, V. ; Lau, C.-W. ; Andrews, K. ; Vo, P. ; Srinivasan, M. ; Lee, D.
Pub. info.: Free-space laser communication technologies XVIII : 24-25 January, 2006, San Jose, California, USA.  pp.610508-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6105
8.

Conference Proceedings

Conference Proceedings
Gorman, J. J. ; LeBurn, T. W. ; Balijepalli, A. ; Cagnon, C. ; Lee, D.
Pub. info.: Optical Trapping and Optical Micromanipulation II.  pp.593023-593023,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5930
9.

Conference Proceedings

Conference Proceedings
Jeong, S. ; Kim, J. ; Kim, S. ; Lee, D.
Pub. info.: Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan.  pp.177-181,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4830
10.

Conference Proceedings

Conference Proceedings
Watson, J.P. ; McInerney, J.G. ; Mooradian, A. ; Lewis, A. ; Shchegrov, A.V. ; Strzelecka, E.M. ; Lee, D. ; Umbrasas, A. ; Carey, G.P. ; Cantos, B.D. ; Hitchens, W.R. ; Doan, V.V. ; Amsden, C. ; Liebman, M.K.
Pub. info.: Genetically Engineered and Optical Probes for Biomedical Applications.  pp.164-171,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4967