1.

Conference Proceedings

Conference Proceedings
Laux,S. ; Kaiser,N. ; Niederwald,H.S. ; Mertin,M. ; Ehlers,H. ; Ristau,D.
Pub. info.: Advances in Optical Interference Coatings : 25-27 May 1999, Berlin, Germany.  pp.76-80,  1999.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3738
2.

Conference Proceedings

Conference Proceedings
Adamik,M. ; Safran,G. ; Barna,P.B. ; Kaiser,U. ; Laux,S. ; Richter,W.
Pub. info.: Developments in optical component coatings : 15-16 May, 1996, Glasgow, Scotland, UK.  pp.310-317,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2776
3.

Conference Proceedings

Conference Proceedings
Laux,S. ; Bernitzki,H. ; Klaus,M. ; Lauth,H. ; Kaiser,N.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.13-16,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
4.

Conference Proceedings

Conference Proceedings
Adamik,M. ; Tomov,I. ; Kaiser,U. ; Laux,S. ; Schmidt,C. ; Richter,W. ; Safran,G. ; Barna,P.B.
Pub. info.: Optical thin films V : new developments : 30 July-1 August 1997, San Diego, California.  pp.123-131,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3133
5.

Conference Proceedings

Conference Proceedings
Laux,S. ; Mann,K.R. ; Kaiser,U. ; Granitza,B. ; Roth,O. ; Richter,W.
Pub. info.: 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995.  pp.440-444,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2714