1.

Conference Proceedings
Conference Proceedings
1. High Temperature Performance of Implanted-Gate n-Channel JFETs in 6H-SiC
Sheppard,S.T. ; Lauer,V. ; Wondrak,W. ; Niemann,E.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1077-1080,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
2.

Conference Proceedings
Conference Proceedings
2. Enlargemcnt of SiC Crystals:Defect Formation at the Interfaces
Anikin,M. ; Pons,M. ; Chourou,K. ; Chaix,O. ; Bluet,J.M. ; Lauer,V. ; Madar,R.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.45-48,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. Experimental Investigation of 4H-SiC Bulk Crystal Growth
Chourou,K. ; Anikin,M. ; Bluet,J.M. ; Lauer,V. ; Guillot,G. ; Camassel,J. ; Juillaguet,S. ; Chaix,O. ; Pons,M. ; Madar,R.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.17-20,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings
Conference Proceedings
4. Observation of biological objects using an optical diffraction tomographic microscope
Lauer,V.
Pub. info.: Laser Microscopy.  pp.122-133,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4164