1.

Conference Proceedings
Conference Proceedings
1. Gold-related levels in relaxed Si1-xGex alloy layers:a study of the pinning effect
Mesli,A. ; Kringhoj,P. ; Larsen,A.Nylandsted
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.145-150,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Substitutional carbon in Ge and Si1-xGex
Hoffmann,L. ; Bach,J.C. ; Hansen,J.Lundsgaard ; Larsen,A.Nylandsted ; Nielsen,B.Bech ; Leary,P. ; Jones,R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.97-102,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Evidence for High Vacancy Concentrations in Heavily Doped n-Type Silicon from Mossbauer Experiments
Weyer,G. ; Fanciulli,M. ; Freitag,K. ; Larsen,A.Nylandsted ; Lindroos,M. ; Muller,E. ; Vestergaard,H.C.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1117-1122,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. Applications of M6ssbauer Spectroscopy to Investigations of Defects in Semiconductors
Larsen,A.Nylandsted ; Petersen,J.W. ; Weyer,G.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1137-1144,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
5.

Conference Proceedings
Conference Proceedings
5. Rapid Thermal Annealing of Ion Implanted Strained Si1-xGex
Thomsen,E.V. ; Larsen,A.Nylandsted ; Hansen,J.L. ; Kringhoj,P. ; Shiryaev,S.Y. ; Weyer,G.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.513-517,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings
Conference Proceedings
6. Tin Related Defect in Electron Irradiated n-Type Silicon Studied by DLTS
Nielsen,J. ; Nielsen,K.Bonde ; Larsen,A.Nylandsted
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.439-444,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
7.

Conference Proceedings
Conference Proceedings
7. Defect impurity complex formation at high donor concentration in silicon
Larsen,A.Nylandsted ; Weyer,G.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.273-278,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87