1.

Conference Proceedings
Conference Proceedings
1. ACTIVATION UNIFORMITY DEPENDENCE OF UNDOPED SEMI-INSULATING GaAs ON POST-IMPLANT ANNEALING CONDITIONS
Lanzieri, C. ; Graffitti, R. ; Cetronio, A.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.373-378,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
2.

Conference Proceedings
Conference Proceedings
2. Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors
Bertuccio, G. ; Binetti, S. ; Caccia, S. ; Casiraghi, R. ; Castaldini, A. ; Cavallini, A. ; Lanzieri, C. ; Donne, A. Le ; Nava, F. ; Pizzini, S. ; Rigutti, L. ; Verzellesi, G. ; Vittone, E.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.1015-1020,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
3.

Conference Proceedings
Conference Proceedings
3. DEFECTS INDUCED BY PROTONS AND ｦﾃ-RAYS IN SEMI-INSULATING GaAs DETECTORS
Castaldini, A. ; Cavallini, A. ; Papa, C. del ; Fuochi, G. ; Alietti, M. ; Canali, C. ; Nava, F. ; Paccagnella, A. ; Lanzieri, C.
Pub. info.: Microstructure of irradiated materials : Symposium held November 29-1 December, 1994, Boston, Massachusetts USA.  pp.523-,  1995.  Pittsburgh, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 373
4.

Conference Proceedings
Conference Proceedings
4. SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range
Bertuccio, G. ; Casiraghi, R. ; Gatti, E. ; Maiocchi, D. ; Nava, F. ; Canali, C. ; Cetronio, A. ; Lanzieri, C.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.941-944,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
5.

Conference Proceedings
Conference Proceedings
5. Influence of Ohmic Contacts on Semi-Insulating GaAs Detector Performances
Castaldini, A. ; Cavallini, A. ; Canali, C. ; Chiossi, C. ; Papa, C. del ; Nava, F. ; Lanzieri, C.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.431-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
6.

Conference Proceedings
Conference Proceedings
6. Comprehensive Hot Electron Assessment of Ku-Band AlGaAs/GaAs Power HFETs: Electrical Characterization, Accelerated Stress, and Simulation
Dieci, D. ; Tomasi, T ; Canali, C. ; Menozzi, R. ; Sozzi, G. ; Lanzieri, C.
Pub. info.: Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands.  pp.205-210,  2000.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 439