1.

Conference Proceedings

Conference Proceedings
Papoulias,P. ; Morgan,C.G. ; Schick,J.T. ; Landman,J.I. ; Rahhal-Orabi,N.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.923-928,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Landman,J.I. ; Morgan,C.G. ; Schick,J.T. ; Kumar,A. ; Papoulias,P. ; Kramer,M.F.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.249-254,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201