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16 results

Conference Proceedings

1. PROPERTIES OF ULTRATHIN AMORPHOUS SILICON NITRIDE FILMS ON III-V SEMICONDUCTORS

Huang, L.J. ; Kwok, R.W.M. ; Lau, W.M. ; Tang, H.T. ; Lennard, W.N. ; Mitchell, I.V. ; Schultz, Peter J. ; Landheer, D.

Pub. info.:	Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.. pp.595-600, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	284

Conference Proceedings

2. Oxidation of InP and Related Materials

Hussey, R.J. ; Sproule, G.I. ; McCaffrey, J.P. ; Driad, R. ; Poole, P.J. ; Landheer, D. ; Graham, M.J. ; SpringThorpe, A.J. ; Pakes, A. ; Echeverria, F. ; Skeldon, P. ; Thompson, G.E.

Pub. info.:	Oxide Films : proceedings of the International Symposium. pp.317-324, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-4

Conference Proceedings

3. Growth of Si02 at the Sc2O3/Si(100) Interface During Annealing

Botton, G.A. ; Romain, E. ; Landheer, D. ; Wu, X. ; Wu, M.-Y. ; Lee, M. ; Lu, Z.-H.

Pub. info.:	Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium. pp.251-261, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-2

Conference Proceedings

4. Thermal Oxidation of III-V Materials and Heterostructures

Hussey, R.J. ; Driad, R. ; Sproule, G.I. ; Moisa, S. ; Fraser, J.W. ; Wasilewski, Z.R. ; McCaffrey, J.P. ; Landheer, D. ; Graham, M.J.

Pub. info.:	Corrosion and corrosion protection : proceedings of the international symposium. pp.645-654, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-22

Conference Proceedings

5. Physical And Electrical Characteristics Of Thin Anodic Oxides On Si(100)

Bardwell, J.A. ; Landheer, D. ; Schmuki, P.

Pub. info.:	Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films. pp.414-424, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-16

Conference Proceedings

6. Anodic Oxides on InSb(100)-Their Formation and Breakdown in Halogen-Ion Containing KOH

Santinacci, L. ; Kleber, S. ; Graham, M.J. ; Landheer, D. ; Schmuki, P.

Pub. info.:	Surface oxide films : proceedings of the international symposium. pp.218-226, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-25

Conference Proceedings

7. Characterization of Gd2O3 Films Deposited on Si(l00) by E-Beam Evaporation from Pressed-Powder Targets

Landheer, D. ; Gupta, J. ; Hulse, J. ; Sproule, I. ; McCaffrey, J. ; Graham, M. ; Yang, K.-C. ; Lu, Z. ; Lennard, W.N.

Pub. info.:	Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium. pp.193-204, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-5

Conference Proceedings

8. Properties of Gate-Quality Silicon Nitride and Oxynitride Dielectrics Deposited Using an Electron Cyclotron-Resonance Plasma Source

Landheer, D. ; Hulse, J.E. ; Quance, T. ; Aers, G.C. ; Sproule, G.I. ; Lennard, W.N. ; Simpson, P.J. ; Nlassoumi, G.R.

Pub. info.:	Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium. pp.75-89, 1999. Pennington, New Jersey. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-6

Conference Proceedings

9. Particle Charge in Nonaqueous Dispersions

Hair, M. L. ; Landheer, D.

Pub. info.:	Industrial applications of surface analysis. pp.313-, 1982. Washington, D.C.. American Chemical Society
Title of ser.:	ACS symposium series
Ser. no.:	199

10.

Conference Proceedings

10. Interface state densities for SiNx:H on cleaved GaAs and InP(110)

Landheer, D. ; Hulse, J.E. ; Rajesh, K.

Pub. info.:	Compound semiconductor surface passivation and novel device processing : symposium held April 5-7, 1999, San Francisco, California, U.S.A.. pp.253-258, 1999. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	573

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