1.

Conference Proceedings
Conference Proceedings
1. Electron Trapping in 4H-SiC MOS Capacitors Fabricated by Sodium-Enhanced Oxidation
A.F. Basile ; A.C. Ahyi ; L.C. Feldman ; J.R. Williams ; P.M. Mooney
Pub. info.: Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA.  pp.757-760,  2012.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 717-720
2.

Conference Proceedings
Conference Proceedings
2. Effects of N Incorporation on Electron Traps at SiO2/SiC Interfaces
A.F. Basile ; S. Dhar ; J.R. Williams ; L.C. Feldman ; P.M. Mooney
Pub. info.: Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA.  pp.717-720,  2012.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 717-720
3.

Conference Proceedings
Conference Proceedings
3. 4H-SiC Oxide Characterization with SIMS Using a 13C Tracer
J.A. Fronheiser ; K. Matocha ; V. Tilak ; L.C. Feldman
Pub. info.: Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain.  pp.513-516,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 615-617
4.

Conference Proceedings
Conference Proceedings
4. BE-SOI WITH ETCH STOP LAYERS GROWN BY RTCVD
D. Feijóo ; M.L. Green ; D. Brasen ; H.S. Luftman ; B.B. Weir ; J. Blanco ; T. Boone ; L.C. Feldman
Pub. info.: Proceedings of the Second International Symposium on Semiconductor Wafer Bonding--Science, Technology, and Applications.  pp.267-279,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-29
5.

Conference Proceedings
Conference Proceedings
5. The Limits of Post Oxidation Annealing in NO
J. Rozen ; X.G. Zhu ; A.C. Ahyi ; J.R. Williams ; L.C. Feldman
Pub. info.: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.693-696,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 645-648