1.

Conference Proceedings
Conference Proceedings
1. High-performance reticle inspection tool for the 65-nm node and beyond
T. -Y. Kang ; C. -H. Chen ; C. -H. Ho ; L. Hsu ; Y. -C. Ku ; K. Nakamura ; H. Moribe ; T. Bashomatsu ; K. Matsumura ; K. Hatta ; H. Takahashi ; A. Uehara ; T. Igeta ; H. Uno ; R. Igarashi ; H. Matsuda
Pub. info.: Photomask and next-generation lithography mask technology XIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6607
2.

Conference Proceedings
Conference Proceedings
2. Uncoiling mechanism of Klebsiella pneumoniae type 3 pili measured by using optical tweezers
F. Chen ; C. Chan ; K. Liu ; Y. Huang ; H. Peng ; H. Chang ; T. Yew ; K. Y. Hsu ; L. Hsu
Pub. info.: Optical trapping and optical micromanipulation IV : 26-29 August 2007, San Diego, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6644