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Conference Proceedings

1. COP Induced Isolation Failures in Cz Wafers

Lee, G.S. ; Kwack, K.D. ; Park, J.G. ; Park, J.M. ; Shim, T.H.

Pub. info.:	ULSI process integration : proceedings of the first international symposium. pp.255-266, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-18

Conference Proceedings

2. Effect of High Temperature RTA on Precipitate Formation and the COP Dissolution

Park, J.G. ; Park, H.P. ; Lee, G.S. ; Kwack, K.D. ; Ryu, K.B. ; Park, J.M.

Pub. info.:	ULSI process integration : proceedings of the first international symposium. pp.157-166, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-18

Conference Proceedings

3. Electron mobility modeling in HgCdTe

Yoo, S.D. ; Jo, N.H. ; Ko, B.G. ; Rho, J.S. ; Lee, S.D. ; Kwack, K.D.

Pub. info.:	Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California. Part 1 pp.41-49, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3436

Conference Proceedings

4. Two-dimensional numerical simulation of HgCdTe infrared detectors

Jo, N.H. ; Yoo, S.D. ; Ko, B.G. ; Lee, S.W. ; Jang, J. ; Lee, S.D. ; Kwack, K.D.

Pub. info.:	Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California. Part 1 pp.50-60, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3436