1.

Conference Proceedings
Conference Proceedings
1. Structural Defects and Critical Electric Field in 3C-SiC
Capano, M.A. ; Smith, A.R. ; Kim, B.C. ; Kvam, E.P. ; Tsoi, S. ; Ramdas, A.K. ; Cooper, J.A.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.431-434,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. GROWTH OF Si1-xGex STRAINED LAYERS USING ATMOSPHERIC-PRESSURE CVD
Namavar, F. ; Manke, J.M. ; Kvam, E.P. ; Sanfacon, M.M. ; Perry, C.H. ; Kalkhoran, N.M.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.285-290,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220
3.

Conference Proceedings
Conference Proceedings
3. Single variant orientational growth of YBa2Cu3O7-x on vicinal (011) SrTiO3 substrates
Vasiliev, A.L. ; Linehan, D.S. ; Kvam, E.P. ; Hou, L. ; McElfresh, M.W.
Pub. info.: Epitaxial oxide thin films II : symposium held November 26-30, 1995, Boston, Massachusetts, U.S.A..  pp.375-380,  1996.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 401