1.

Conference Proceedings

Conference Proceedings
Satoh, M. ; Nakaike, Y. ; Uchimura, K. ; Kuriyama, K.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.905-908,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
2.

Technical Paper

Technical Paper
Yokoyama, T. ; Naganuma, Y. ; Kuriyama, K. ; Arimoto, M.
Pub. info.: 2003 SAE world congress : technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2003
3.

Conference Proceedings

Conference Proceedings
Fung, A.W.P. ; Rao, A.M. ; Kuriyama, K. ; Dresselhaus, M.S. ; Dresselhaus, G. ; Endo, M.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.335-340,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
4.

Conference Proceedings

Conference Proceedings
Kuriyama, K. ; Suzuki, T. ; Hirumi, J. ; Yoshioka, N. ; Hojo, Y. ; Kawase, Y. ; Hara, S. ; Hoga, M. ; Watanabe, S.W. ; Inoue, M. ; Kawase, H. ; Kamimoto, T.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.660-671,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
5.

Conference Proceedings

Conference Proceedings
Kawase, H. ; Kamimoto, T. ; Ogasawara, H. ; Kuriyama, K. ; Hirumi, J. ; Yoshioka, N.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.638-647,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
6.

Conference Proceedings

Conference Proceedings
Kuriyama, K. ; Machiya, Y. ; Yamasaki, K. ; Narukawa, S. ; Hayashi, N.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.626-633,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853
7.

Conference Proceedings

Conference Proceedings
Hirumi, J. ; Kuriyama, K. ; Yoshioka, N. ; Yoshikawa, R. ; Hojo, Y. ; Matuzaka, T. ; Tanaka, K. ; Hoga, M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.309-317,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
8.

Conference Proceedings

Conference Proceedings
Suzuki, T. ; Hirumi, J. ; Yoshioka, N. ; Hojyo, Y. ; Kawase, Y. ; Sakamoto, S. ; Kuriyama, K. ; Narukawa, S. ; Houga, M.
Pub. info.: 24th Annual BACUS Symposium on Photomask Technology.  pp.1186-1194,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5567
9.

Conference Proceedings

Conference Proceedings
Kuriyama, K. ; Hirumi, J. ; Yoshioka, N. ; Hojo, Y. ; Kawase, Y. ; Hara, S. ; Hoga, M. ; Watanabe, S.W. ; Inoue, M. ; Kawase, H. ; Kamimoto, T.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part One  pp.83-93,  2002.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889
10.

Conference Proceedings

Conference Proceedings
Suzuki, T. ; Kuriyama, K. ; Hirumi, J. ; Yoshioka, N. ; Kawase, H. ; Kamimoto, T.
Pub. info.: 23rd Annual BACUS Symposium on Photomask Technology.  pp.785-792,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5256