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18 results

Conference Proceedings

1. Microcellular Plastics: Does Microcellular Structure Always Lead To An Improvement In Impact Properties? (1245)

Kumar,V.

Pub. info.:	ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002. 2 pp.1892-1896, 2002. Brookfield, Conn.. Society of Plastic Engineers.
Title of ser.:	Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.:	60

Conference Proceedings

2. IR detector performance in an area array

Dhar,V. ; Gopal,V. ; Kumar,V.

Pub. info.:	16th International conference on photoelectronics and night vision devices : 25-27 May 2000 Moscow, Russia. pp.31-48, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4340

Conference Proceedings

3. Adaptive teleoperation transparency based on impedance modeling

Heredia,E.A. ; Kumar,V. ; Rahman,T.

Pub. info.:	Telemanipulator and telepresence technologies III : 18-19 November 1996, Boston, Massachusetts. pp.2-12, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2901

Conference Proceedings

4. Solar-blind Alx Ga1-x N p-i-n photodetectors grown on LEO and non-LEO GaN

Sandvik,P.M. ; Walker,D. ; Kung,P. ; Mi,K. ; Shahedipour,F. ; Kumar,V. ; Zhang,X. ; Diaz,J. ; Jelen,C.L. ; Razeghi,M.

Pub. info.:	Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.265-272, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3948

Conference Proceedings

5. LM-HEMT and P-HEMT-Technology for Ultra High Frequency Devices

Mokerov,V.G. ; Gulyaev,Yu.V. ; Amelin,D.V. ; Bugaev,A.S. ; Fedoroy,Yu.V. ; Hook,A.V. ; Kaminsky,V.E. ; Velikovskii,L.E. ; Kumar,V. ; Muralidharan,R.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.884-891, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

6. Surface Characterisation of n-HgCdTe by Analysis of Magnetic Field Dependent Hall Data

Pal,R. ; Sharma,B.L. ; Durai,L. ; Gopal,V. ; Kumar,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.814-817, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

7. Characterisation of Metalorganic Chemical Vapour Deposited CdTe Films on Sapphire for HgCdTe Passivation

Pal,R. ; Bhatt,M. ; Narang,V. ; Singh,R.A. ; Dube,G.C. ; Kumar,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.810-813, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

8. Some Critical Processes in the Fabrication of(Hg1-xCdx)Te Photoconductive Linear Arrays

Vandna Mittal ; Monga,K. ; Pathak,H.T. ; Singh,R. ; Gopal,V. ; Kumar,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.803-805, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

9. Fiber optic sensor for methane hazards

Kumar,V. ; Chandra,D.

Pub. info.:	Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.139-149, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3897

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Conference Proceedings

10. Effect of Gamma Radiation on GaAs Mesfets

Manchanda,R. ; Nayyar,N.K. ; Balakrishnan,V.R. ; Kumar,V.

Pub. info.:	Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.554-557, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3975

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