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16 results

Conference Proceedings

1. Development of a pulse heating thermographic NDT technique for detection of latent blister in corrosion protective coating on oil storage tank

Sakagami,T. ; Kubo,S. ; Sekine,K. ; Yamada,M. ; Nakata,K. ; Maruyama,H.

Pub. info.:	Thermosense XXIII : 16-19 April 2001, Orlando, USA. pp.554-559, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4360

Conference Proceedings

2. Development of a new diagnosis method for caries in human teeth based on thermal images under pulse heating

Sakagami,T. ; Kubo,S. ; Naganuma,T. ; Inoue,T. ; Matsuyama,K. ; Kaneko,K.

Pub. info.:	Thermosense XXIII : 16-19 April 2001, Orlando, USA. pp.504-510, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4360

Conference Proceedings

3. Advanced mask technology for 230-mm reticle fabrication

Hiruta,K. ; Kubo,S. ; Iwamatsu,T. ; Fujisawa,T. ; Sugiyama,M. ; Morimoto,H.

Pub. info.:	19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California. Part2 pp.853-857, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3873

Conference Proceedings

4. Fatigue crack identification using near-tip singular temperature field measured by lock-in thermography

Sakagami,T. ; Kubo,S. ; Teshima,Y.

Pub. info.:	Thermosense XXII: 25-27 April 2000, Orlando, Florida. pp.174-181, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4020

Conference Proceedings

5. Development of the large-area silicon PIN diode with 2-millimeter-thick depletion layer for hard x-ray detector (HXD) on board Astro-E

Sugizaki,M. ; Kubo,S. ; Murakami,T. ; Ota,N. ; Ozawa,H. ; Takahashi,T. ; Kaneda,H. ; Iyomoto,N. ; Kamae,T. ; Kokubun,M. ; Kubota,A. ; Makishima,K. ; Tamura,T. ; Tashiro,M. ; Koyama,K. ; Tsunemi,H.

Pub. info.:	Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California. pp.244-253, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3115

Conference Proceedings

6. Proposal for a new thermographic nondestructive testing technique using microwave heating

Sakagami,T. ; Kubo,S. ; Komiyama,T. ; Suzuki,H.

Pub. info.:	Thermosense XXI. pp.99-103, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3700

Conference Proceedings

7. Development methods for chemical amplification resist

Saitoh,H. ; Soga,T. ; Kubo,S. ; Sanki,S. ; Hoga,M.

Pub. info.:	Photomask and X-Ray Mask Technology V. pp.269-278, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3412

Conference Proceedings

8. Damage inspection of CFRP using resistive-heating thermographic NDT

Sakagami,T. ; Ogura,K. ; Kubo,S.

Pub. info.:	Thermosense XVIII: An International Conference on Thermal Sensing and Imaging Diagnostic Applications. pp.178-184, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2766

Conference Proceedings

9. Visualization of contact stress distribution using infrared stress measurement system

Sakagami,T. ; Ogura,K. ; Kubo,S. ; Lesniak,J.R. ; Boyce,B.R. ; Sandor,B.I.

Pub. info.:	Thermosense XIX: An International Conference on Thermal Sensing and Imaging Diagnostic Applications. pp.250-259, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3056

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Conference Proceedings

10. Effect of pre-treatment of GaN substrate for homoepitaxial growth by rf MBE

Kubo,S. ; Okazaki,T. ; Manabe,S. ; Kurai,S. ; Taguchi,T.

Pub. info.:	Optoelectronic Materials and Devices II. pp.58-65, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4078

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Author: Kubo,S.