1.

Conference Proceedings

Conference Proceedings
Opsal, J.L. ; Leng, J. ; Ke, C.-M. ; Chen, P.-H. ; Chen, J.-H. ; Ku, Y.-C.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.6-18,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
2.

Technical Paper

Technical Paper
Rho, J.-H. ; Ku, Y.-C. ; Lee, D.H. ; Kee, J.-D. ; Kim, K.-Y.
Pub. info.: 2009 SAE world congress : technical paper.  2009.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2009
3.

Conference Proceedings

Conference Proceedings
Chen, L.-J. ; Ke, C.-M. ; Yu, S.S. ; Gau, T.-S. ; Chen, P. ; Ku, Y.-C. ; Lin, B.J. ; Engelhard, D. ; Hetzer, D. ; Yang, J.Y. ; Barry, K.A. ; Yap, L. ; Yang, W.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.568-576,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
4.

Conference Proceedings

Conference Proceedings
Ke, C.-M. ; Yu, S.-S. ; Wang, Y.-H. ; Chou, Y.-J. ; Chen, J.-H. ; Lee, B.-H. ; Chu, H.-Y. ; Lin, H.-T. ; Gau, T.-S. ; Lin, C.-H. ; Ku, Y.-C. ; Lin, B.J. ; Huang, J. ; Hsu, J.J. ; Liu, V. ; Hetzer, D. ; Yap, L. ; Yang, W. ; Araki, K.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.597-604,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
5.

Conference Proceedings

Conference Proceedings
Ke, C.-M. ; Hung, H.-L. ; Chang, A. ; Chen, J.-H. ; Gau, T.-S. ; Ku, Y.-C. ; Lin, B.J. ; Otaka, T. ; Ueda, K. ; Kawada, H. ; Nomura, H. ; Ren, N.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.173-182,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
6.

Conference Proceedings

Conference Proceedings
Chan, C.-K. ; Ku, Y.-C. ; Chen, L.-K.
Pub. info.: Network Architectures, Management, and Applications IV.  pp.63540Y-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6354