1.

Conference Proceedings
Conference Proceedings
1. Characterization, Electrical Properties, and Interface Engineering of Sputtered Ba0.5Sr0.5 TiO3 Thin Films for DRAM Applications
Chu, P. ; Zafar, S. ; Kottke, M. ; Remmel, T. ; Melnick, B. ; Jones, R.E., Jr.
Pub. info.: Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues, proceedings of the fourth International Symposium and Thin Film Materials for Advanced Packaging Technologies : proceedings of the second International Symposium.  pp.83-90,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-7
2.

Conference Proceedings
Conference Proceedings
2. (4.18) 8:16 - 8:19 PM - Enhancement of SiGe Relaxation for Fabrication of SGOI Substrates Using Condensation
Sadaka, M. ; Thean, A. ; Barr, A. ; White, T. ; Vartanian, V. ; Zavala, M. ; Nguyen, B-Y. ; Xie, Q. ; Liu, R. ; Wang, X-D. ; Kottke, M. ; Zollner, S. (Freescale)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.281-288,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07
3.

Conference Proceedings
Conference Proceedings
3. TME EFFECTS OF Si ADDITION ON THE PROPERTIES OF AlCu FILMS USED IN MULTILEVEL METAL SYSTEMS
Wilson, S. R. ; Weston D. ; Kottke, M.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.545-548,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181
4.

Conference Proceedings
Conference Proceedings
4. Theoretical and Experimental Analysis of the Low Dielectric Constant of Fluorinated Silica
Angyal, M. ; baugh, Ash. ; D, M. ; Demkov, A. ; Filipiak, S. ; Gregory, R. B. ; Kottke, M. ; Liu, R. ; Mclntyre, L. C. ; Werho, D. ; Zollner, S.
Pub. info.: The optical properties of materials : symposium held November 30-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.255-260,  2000.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 579
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Conference Proceedings
Conference Proceedings
5. Theoretical And Experimental Analysis Of The Low Dielectric Constant Of Fluorinated Silica
Demkov, A.A. ; Zollner, S. ; Liu, R. ; Werho, D. ; Kottke, M. ; Gregory, R.B. ; Angyal, M. ; Filipiak, S. ; Adams, G.B.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D3.8-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
6.

Conference Proceedings
Conference Proceedings
6. Epitaxial growth of AlN on Si substrates with intermediate 3C-SiC as buffer layers
Hong, S. Q. ; Liaw, H. M. ; Linthicum, K. ; Davis, R. F. ; Fejes, P. ; Zollner, S. ; Kottke, M. ; Wilson, S. R.
Pub. info.: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.407-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 572