1.

Conference Proceedings

Conference Proceedings
Michael, E. A. ; Mikulics, M. ; Marso, M. ; Kordos, P. ; Luth, H. ; Vowinkel, B. ; Schieder, R. ; Stutzki, J.
Pub. info.: Millimeter and submillimeter detectors for astronomy II : 23-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.525-536,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5498
2.

Conference Proceedings

Conference Proceedings
Zheng, X. ; Wu, S. ; Adam, R. ; Mikulics, M. ; Foerster, A. ; Schelten, J. ; Siegel, M. ; Kordos, P. ; Sobolewski, R.
Pub. info.: Advanced optical devices, technologies, and medical applications : 19-22 August 2002, Riga, Latvia.  pp.68-78,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5123
3.

Conference Proceedings

Conference Proceedings
Javorka, P. ; Alam, A. ; Marso, M. ; Wolter, M. ; Fox, A. ; Heuken, M. ; Kordos, P.
Pub. info.: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.527-536,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 743
4.

Technical Paper

Technical Paper
Hunicz, J. ; Kordos, P.
Pub. info.: 2009 SAE Powertrains, Fuels & Lubricants Meeting : technical paper.  2009.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2009
5.

Conference Proceedings

Conference Proceedings
Adam, R. ; Mikulics, M. ; Wu, S. ; Zheng, X. ; Marso, M. ; Camara, I. ; Siebe, F. ; Gysten, R. ; Foerster, A. ; Kordos, P. ; Sobolewski, R.
Pub. info.: Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII.  pp.321-332,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5352