Aguirre, A. D. ; Herz, P. R. ; Chen, Y. ; Fujimoto, J. G. ; Piyawattanametha, W. ; Fan, L. ; Hsu, S. ; Fujino, M. ; Wu, M. C. ; Kopf, D.
Pub. info.:
Advanced biomedical and clinical diagnostic systems III : 23-26 January 2005, San Jose, California, USA. pp.277-282, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bourquin, S. ; Hartl, I. ; Aguirre, A.D. ; Hsiung, P.-L. ; Ko, T.H. ; Birks, T.A. ; Wadsworth, W.J. ; Buenting, U. ; Kopf, D. ; Fujimoto, J.G.
Pub. info.:
Coherence domain optical methods and optical coherence tomography in biomedicine VII : 27-29 January 2003, San Jose, California, USA. pp.4-8, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Killi, A. W. ; Lederer, M. J. ; Kopf, D. ; Morgner, U.
Pub. info.:
Solid state lasers and amplifiers : 27-29 April 2004, Strasbourg, France. pp.247-254, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Netti, C. M. ; Zoorob, M. ; Roberts, S. ; Charlton, M. ; Parker, G. J. ; Baumberg, J. J. ; Lincoln, J. R. ; Lederer, M. ; Kopf, D.
Pub. info.:
Coherence domain optical methods and optical coherence tomography in biomedicine IX : 23-26 January 2005, San Jose, California, USA. pp.222-227, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bourquin, S. ; Aguirre, A.D. ; Hartl, I. ; Hsiung, P.-L. ; Ko, T.H. ; Birks, T.A. ; Wadsworth, W.J. ; Buenting, U. ; Kopf, D. ; Fujimoto, J.G.
Pub. info.:
Optical coherence tomography and coherence techniques : 22-24 June 2003, Munich, Germany. pp.155-159, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering