1.

Conference Proceedings

Conference Proceedings
Amemiya, K. ; Takahashi, H. ; Naruse, T. ; Nakazawa, M. ; Yanagie, H. ; Hisa, T. ; Eriguchi, M. ; Nakagawa, Y. ; Majima, T. ; Kageji, T. ; Sakurai, Y. ; Kobayashi, T. ; Konishi, T. ; Hieda, K. ; Yasuda, N. ; Ogura, K.
Pub. info.: Nanobiophotonics and biomedical applications : 26-27 January 2004, San Jose, California, USA.  pp.44-51,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5331
2.

Conference Proceedings

Conference Proceedings
Ito, O. ; Konishi, T. ; Fujittuka, M.
Pub. info.: Fullerenes 2000 : electrochemistry and photochemistry, proceedings of the International Symposium.  pp.140-154,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-10
3.

Conference Proceedings

Conference Proceedings
Nakanishi, I. ; Fukuzumi, S. ; Konishi, T. ; Ohkubo, K. ; Fujitsuka, M. ; Ito, O. ; Miyata, N.
Pub. info.: Fullerenes : fullerenes for the new millennium : proceedings of the International Symposium on Fullerenes, Nanotubes, and Carbon Nanoclusters.  pp.138-151,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-11
4.

Conference Proceedings

Conference Proceedings
Konishi, T. ; Tsujikawa, S.
Pub. info.: Proceedings of the Symposium on Passivity and its Breakdown.  pp.824-833,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-26
5.

Conference Proceedings

Conference Proceedings
Hirai, Y. ; Konishi, T. ; Kanakugi, T. ; Kawata, H. ; Kikuta, H.
Pub. info.: Nanoengineering: fabrication, properties, optics, and devices : 4-6 August, 2004, Denver, Colorado.  pp.187-194,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5515
6.

Conference Proceedings

Conference Proceedings
Okuda, M. ; Kobayashi, Y. ; Kondoh, T. ; Konishi, T. ; Yoshimura, H.
Pub. info.: Nanoengineering : fabrication, properties, optics, and devices III : 15-17 August, 2006, San Diego, California, USA.  pp.63270K-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6327
7.

Conference Proceedings

Conference Proceedings
Konishi, T. ; Kojima, Y. ; Okuda, Y. ; Philipsen, V. ; Leunissen, A. H. L. ; Van Look, L.
Pub. info.: EMLC 2006 : 22nd European Mask and Lithography Conference : 23-26 January 2006, Dresden, Germany.  pp.62810S-,  2006.  Bellingham, Wash.,.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6281
8.

Conference Proceedings

Conference Proceedings
Shinohara, T. ; Yoshiyama, T. ; Sogami, I.S. ; Konishi, T. ; Ise, N.
Pub. info.: Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan.  pp.383-386,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 132
9.

Conference Proceedings

Conference Proceedings
Yu, W. ; Kikuta, H. ; Konishi, T.
Pub. info.: Lithographic and micromachining techniques for optical component fabrication II : 3-4 August 2003, San Diego, California, USA.  pp.184-191,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5183
10.

Conference Proceedings

Conference Proceedings
Ochi, N. ; Iyono, A. ; Kimura, H. ; Konishi, T. ; Nakatsuka, T. ; Ohara, S. ; Takahashi, N. ; Tsuji, S. ; Wada, T. ; Yamamoto, I. ; Yamashita, Y. ; Yanagimoto, Y.
Pub. info.: Particle astrophysics instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.26-34,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4858