Superplasticity in advanced materials : ICSAM-97 : proceedings of the 1997 International Conference on Superplasticity in Advanced Materials (ICSAM-97), held at the Indian Institute of Science, Bangalore on January 29 to 31, 1997. pp.115-124, 1997. Zuerich, Switzerland. Trans Tech Publications
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland. pp.68-75, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Superplasticity in advanced materials : ICSAM-97 : proceedings of the 1997 International Conference on Superplasticity in Advanced Materials (ICSAM-97), held at the Indian Institute of Science, Bangalore on January 29 to 31, 1997. pp.337-344, 1997. Zuerich, Switzerland. Trans Tech Publications