1.

Conference Proceedings

Conference Proceedings
Koike,M. ; Suzuki,I.H. ; Komiya,S. ; Amemiya,Y.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.184-191,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
2.

Conference Proceedings

Conference Proceedings
Horii,Y. ; Kikuchi,Y. ; Kase,M. ; Komiya,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1887-1890,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201