1.

Conference Proceedings

Conference Proceedings
Schneider,H. ; Walther,M. ; Fleissner,J. ; Rehm,R. ; Diwo,E. ; Schwarz,K. ; Koidl,P. ; Weimann,G. ; Ziegler,J. ; Breiter,R. ; Cabanski,W.A.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.353-362,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
2.

Conference Proceedings

Conference Proceedings
Rehm,R. ; Schneider,H. ; Schwarz,K. ; Walther,M. ; Koidl,P. ; Weimann,G.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.379-385,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
3.

Conference Proceedings

Conference Proceedings
Koidl,P. ; Wild,Ch. ; Dischler,B. ; Wagner,J. ; Ramsteiner,M.
Pub. info.: Properties and characterization of amorphous carbon films.  pp.41-70,  1990.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 52-53
4.

Conference Proceedings

Conference Proceedings
Schneider,H. ; Koidl,P. ; Walther,M. ; Lao,Z. ; Schlechtweg,M.
Pub. info.: Materials and electronics for high-speed and infrared detectors : 19-20 and 23 July 1999, Denver, Colorado.  pp.47-53,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3794