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21 results

Conference Proceedings

1. Evolutionary computation and post-wildfire land-cover mapping with multispectral imagery

Brumby,S.P. ; Koch,S.W. ; Hansen,L.A.

Pub. info.:	Remote sensing for environmental monitoring, GIS applications, and geology : 18-21 September 2001, Toulouse, France. pp.174-183, 2001. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4545

Conference Proceedings

2. Coherent control and quantum correlations in quantum-well semiconductor microcavity

Lee,Y.-S. ; Norris,T.B. ; Kira,M. ; Jahnke,F. ; Koch,S.W. ; Khitrova,G. ; Gibbs,H.M.

Pub. info.:	Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California. pp.16-26, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3940

Conference Proceedings

3. Optical nonlinearities in semiconductors

Koch,S.W. ; Meier,T.

Pub. info.:	Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.24-35, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3896

Conference Proceedings

4. Coherent effects in semiconductor light emission

Kira,M. ; Jahnke,F. ; Hoyer,W. ; Koch,S.W.

Pub. info.:	Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California. pp.7-15, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3940

Conference Proceedings

5. Optical nonlinearities in semiconductors

Koch,S.W. ; Meier,T.

Pub. info.:	Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.24-35, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3897

Conference Proceedings

6. Microscopic theory of semiconductor light emission

Kira,M. ; Jahnke,F. ; Hoyer,W. ; Koch,S.W.

Pub. info.:	Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part1 pp.192-200, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3944

Conference Proceedings

7. Modeling high-power semiconductor lasers:from microscopic physics to device applications

Moloney,J.V. ; Kolesik,M. ; Hader,J. ; Koch,S.W.

Pub. info.:	Advanced high-power lasers : 1-5 November 1999, Osaka, Japan. pp.120-127, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3889

Conference Proceedings

8. Polariton propagation and additional boundary conditions

Jahnke,F. ; Schneider,H.C. ; Koch,S.W.

Pub. info.:	Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part1 pp.166-170, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3944

Conference Proceedings

9. Optical nonlinearities in semiconductors

Koch,S.W. ; Meier,T.

Pub. info.:	Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures. pp.24-35, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3899

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Conference Proceedings

10. Propagation effects in semiconductor multiple quantum well structures

Stroucken,T. ; Knorr,A. ; Koch,S.W. ; Hubner,M. ; Kuhl,J.

Pub. info.:	Physics and Simulation of Optoelectronic Devices IV. pp.238-249, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2693

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