1.

Conference Proceedings

Conference Proceedings
Tseng, W. F. ; Comas, J. ; Steiner, B. ; Metze, G. ; Cornfeld, A. ; Klein, P. B. ; Gaskill, D> K. ; Xia, W. ; Lau, S. S.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.117-122,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
2.

Conference Proceedings

Conference Proceedings
Klein, P. B.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.437-442,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings

Conference Proceedings
Klein, P. B. ; Freitas, J. A. Jr. ; Binari, S. C.
Pub. info.: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.547-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 572
4.

Conference Proceedings

Conference Proceedings
Maltez, R. L. ; Liliental-Weber, Z. ; Washburn, J. ; Behar, M. ; Klein, P. B. ; Specht, P. ; Weber, E. R.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.319-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
5.

Conference Proceedings

Conference Proceedings
Andry, P. S. ; Varhue, W. J. ; Adams, E. ; Lavoie, M. ; Klein, P. B. ; Hengehold, R. ; Hunter, J.
Pub. info.: Rare earth doped semiconductors II : symposium held April 8-10, 1996, San Francisco, California, U.S.A..  pp.57-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 422