1.

Conference Proceedings

Conference Proceedings
Kirscht, F. ; Orschel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Shabani, M. ; Buczkowski, A.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.173-178,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
2.

Conference Proceedings

Conference Proceedings
Buczkowski, A. ; Orsehel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Kirscht, F.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.299-310,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
3.

Conference Proceedings

Conference Proceedings
Park, J.E. ; Schroder, D.K. ; Tan, SE. ; Choi, B.D. ; Fletcher, M. ; Buczkowski, A. ; Kirscht, F.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.383-395,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
4.

Conference Proceedings

Conference Proceedings
Kirscht, F. ; Snegirev, B. ; Zaumseil, P. ; Kissinger, G. ; Takashima, K. ; Wildes, P. ; Hennessy, J.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.60-67,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12