1.

Conference Proceedings
Conference Proceedings
1. Towards 0.5 nm EOT Scaling of HfO2/Metal Electrode Gate Stacks
Peterson, J. J. ; Brown, G. A. ; Matthews, K. ; Gutt, J. ; Gopalan, S. ; Li, H. -J. ; Kirsch, P. ; Barnett, J. ; Moumen, N. ; Huffman, C. ; Majhi, P. ; Chaudhary, N. ; Young, C. D. ; Sassman, B. ; Lee, B. -H. ; Ruelke, H. ; Schuehrer, H. ; Stephan, R. ; Wei, A. ; Werner, T. ; Wieczorek, K. ; Raab, M.
Pub. info.: Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium.  pp.443-451,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-04
2.

Conference Proceedings
Conference Proceedings
2. Recent Development of CMOS Technology with Hf-Based High-k Dielectric
Song, S.C. ; Bersuker, G. ; Zhang, Z. ; Lee, B.H. ; Huffman, C. ; Bae, S.H. ; Sim, J.H. ; Kirsch, P. ; Majhi, P. ; Moumen, N, ; Ramiller, C.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.456-470,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
3.

Conference Proceedings
Conference Proceedings
3. Light-emitting materials based on liquid crystals (Invited Paper)
Suzuki, M. ; Sato, H. ; Kirsch, P. ; Sawada, A. ; Naemura, S.
Pub. info.: Liquid Crystals VIII.  pp.51-65,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5518