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26 results

Conference Proceedings

1. Performance of polycrystalline silicon waveguide devices for compact on-chip optical interconnection

Lee,K.K. ; Lim,D.R. ; Agarwal,A. ; Ripin,D. ; Fujimoto,H.H. ; Morse,M. ; Kimerling,L.C.

Pub. info.:	Optical devices for fiber communication : 20-21 September 1999, Boston, Massachusetts. pp.120-125, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3847

Conference Proceedings

2. Micron-sized channel-dropping filters using silicon waveguide devices

Lim,D.R. ; Little,B.E. ; Lee,K.K. ; Morse,M. ; Fujimoto,H.H. ; Haus,H.A. ; Kimerling,L.C.

Pub. info.:	Optical devices for fiber communication : 20-21 September 1999, Boston, Massachusetts. pp.65-71, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3847

Conference Proceedings

3. Ge-on-Si high-responsivity near-infrared photodetectors

Masini,C. ; Colace,L. ; Assanto,G. ; Luan,H.-C. ; Wada,K. ; Kimerling,L.C.

Pub. info.:	Silicon-based optoelectronics II : 28 January 2000, San Jose, California. pp.103-109, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3953

Conference Proceedings

4. In-Situ Determination of Si Wafer Contamination Using Photoconductance Decay Measurements*

Michel,J. ; Reddy,A.J. ; Norga,G.J. ; Platero,M. ; Kimerling,L.C.

Pub. info.:	Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.212-222, 1997. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3322

Conference Proceedings

5. Evaluation of irradiation-induced deep leveis in Si

Kono,K. ; Sandland,J.G. ; Wada,K. ; Kimerling,L.C.

Pub. info.:	X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.267-273, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4140

Conference Proceedings

6. Nonstoichiometry Related Acceptors in GaAs

Kimerling,L.C. ; Asom,M.T. ; Thiel,F.A. ; Parsey,J.M.Jr.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.945-950, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

7. High Sensitivity Detection of Silicon Surface Reactions by Photoconductance Decay

Norga,G.J. ; Black,M.R. ; Black,K.A. ; M'Saad,H. ; Michel,J. ; Kimerling,L.C.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1531-1536, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

8. Interstitial Defect Reactions in Silicon

Kimerling,L.C. ; Asom,M.T. ; Benton,J.L. ; Drevinski,P.J. ; Caefer,C.E.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part1 pp.141-150, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

9. Energy transfer processes at erbium ions in silicon

Michel,J. ; Palm,J. ; Chen,T. ; Duan,X. ; Oullette,E. ; Ahn,S.H. ; Nelson,S.F. ; Kimerling,L.C.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1485-1490, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

10.

Conference Proceedings

10. Erbium in Silicon:A Defect System for Optoelectronic Integrated Circuits

Michel,J. ; Palm,J. ; Gan,F. ; Ren,F.Y.G. ; Zheng,B. ; Dunham,S.T. ; Kimerling,L.C.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.585-590, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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