1.

Conference Proceedings

Conference Proceedings
Jang,W.-I. ; Choi,C.-A. ; Lee,M.-L. ; Jun,C.-H. ; Kim,Y.T.
Pub. info.: Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA.  pp.444-450,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4174
2.

Conference Proceedings

Conference Proceedings
Choi,C.-A. ; Jang,W.-I. ; Lee,M.-L. ; Kim,Y.T.
Pub. info.: Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA.  pp.307-313,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4174
3.

Conference Proceedings

Conference Proceedings
Jung,M.-Y. ; Ryu,H. ; Lee,M.-L. ; Jun,C.-H. ; Kim,Y.T.
Pub. info.: Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA.  pp.111-118,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4557
4.

Conference Proceedings

Conference Proceedings
Jun,C.-H. ; Choi,C.-A. ; Jang,W.I. ; Kim,Y.T.
Pub. info.: Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA.  pp.415-422,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4557
5.

Conference Proceedings

Conference Proceedings
Jang,W.I. ; Choi,C.A. ; Hong,Y.S. ; Jun,C.H. ; Kim,Y.T. ; Lee,J.H.
Pub. info.: Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.332-339,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3892
6.

Conference Proceedings

Conference Proceedings
Kim,Y.T. ; Kim,D.J. ; Lee,S. ; Park,Y.K. ; Kim,I.-S. ; Park,J.-W.
Pub. info.: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland.  pp.227-233,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3743
7.

Conference Proceedings

Conference Proceedings
Jun,C.-H. ; Kim,S.-K. ; Kwag,D.-S. ; Kim,Y.T.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part2  pp.931-938,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
8.

Conference Proceedings

Conference Proceedings
Kim,Y.T. ; Kim,Y.-Y. ; Jun,C.-H.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part2  pp.924-930,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
9.

Conference Proceedings

Conference Proceedings
Kim,D.J. ; Kim,Y.T. ; Park,Y.K. ; Sim,H.S. ; Park,J.-W.
Pub. info.: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland.  pp.324-331,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3743
10.

Conference Proceedings

Conference Proceedings
Jang,W.I. ; Lee,Y.I. ; Choi,C.A. ; Jun,C.H. ; Kim,Y.T.
Pub. info.: Electronics and structures for MEMS : 27-29 October, 1999, Royal Pines Resort, Queensland, Australia.  pp.395-402,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3891