1.

Conference Proceedings
Conference Proceedings
1. Novel concept of TDI readout circuit for LWIR detector
Kim,B. ; Yoon,N. ; Lee,H.C. ; Kim,C.-K.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.166-172,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
2.

Conference Proceedings
Conference Proceedings
2. Optimization of alignment key in electron-beam lithography
Kim,C.-K. ; Hur,C. ; Kim,Y.-S. ; Baik,K.-H.
Pub. info.: Emerging lithographic technologies III : 15-17 March 1999, Santa Clara, California.  Part2  pp.528-535,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3676
3.

Conference Proceedings
Conference Proceedings
3. Novel and high-yield fabrication of electroplated 30 microcoils for MEMS and microelectronics
Yoon,J.-B. ; Han,C.-H. ; Yoon,E. ; Kim,C.-K.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.233-240,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511
4.

Conference Proceedings
Conference Proceedings
4. Uniform and simultaneous fabrication of high-precision and high-density orifice,channel,and reservoirs for ink-jet printheads
Yoon,J.-B. ; Lee,J.-D. ; Han,C.-H. ; Yoon,E. ; Kim,C.-K.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.214-224,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511
5.

Conference Proceedings
Conference Proceedings
5. Planarization and trench filling on severe surface topography with thick photoresist for MEMS
Yoon,J.-B. ; Oh,G.Y. ; Han,C.-H ; Yoon,E. ; Kim,C.-K.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.297-306,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511
6.

Conference Proceedings
Conference Proceedings
6. Comparison study on mask error factor in 100-nm ArF and KrF lithography
Eom,T.-S. ; Hyun,Y.-S. ; Kim,C.-K. ; Bok,C.-K. ; Shin,K.-S.
Pub. info.: Optical Microlithography XIV.  4346  pp.869-878,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346
7.

Conference Proceedings
Conference Proceedings
7. Novel two-step baking process for high-aspect-ratio photolithography with conventional positive thick photoresist
Yoon,J.-B. ; Han,C.-H. ; Kim,C.-K.
Pub. info.: Materials and Device Characterization in Micromachining.  pp.316-325,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3512
8.

Conference Proceedings
Conference Proceedings
8. Multilevel microstructure fabrication using single-step 3D photolithography and single-step electroplating
Yoon,J.-B. ; Lee,J.-D. ; Han,C.-H. ; Yoon,E. ; Kim,C.-K.
Pub. info.: Materials and Device Characterization in Micromachining.  pp.358-366,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3512
9.

Conference Proceedings
Conference Proceedings
9. Novel monolithic and multilevel integration of high-precision 3-D microfluidic components
Yoon,J.-B. ; Han,C.-H. ; Yoon,E. ; Kim,C.-K.
Pub. info.: Microfluidic Devices and Systems.  pp.183-191,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3515