1.

Conference Proceedings

Conference Proceedings
Shim, K.-C. ; Kim, M.-S. ; Lee, E.-S. ; Lee, C.-S. ; Gil, M.-G. ; Kim, B.-H. ; In, J.-S. ; Yoon, T.-B. ; Kim, J.-S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part Two  pp.919-926,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689
2.

Conference Proceedings

Conference Proceedings
Suh, S.-H. ; Kim, J.-S. ; Seo, D.-W. ; Hahn, S.-R. ; Sivananthan, S.
Pub. info.: Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA.  pp.1-7,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4795
3.

Conference Proceedings

Conference Proceedings
Kim, J.-S. ; An, S.-Y. ; Suh, S.-H.
Pub. info.: Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA.  pp.207-212,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4795
4.

Conference Proceedings

Conference Proceedings
Pack, S.H. ; Hong, E.S. ; Choi, Y.H. ; Park, I..K. ; Kim, J.-S. ; Ko, D.
Pub. info.: Multimedia Systems and Applications V.  pp.83-94,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4861
5.

Conference Proceedings

Conference Proceedings
Choi, S.-J. ; Cha, H.-S. ; Yoon, S.-Y. ; Kim, Y.-D. ; Lee, D.-H. ; Kim, J.-M. ; Kim, J.-S. ; Min, D.-S. ; Jang, P.-J. ; Chang, B.-S. ; Kwon, H.-J. ; Choi, B.-Y. ; Choi, S.-S. ; Jeong, S.H.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology IX.  pp.303-311,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4754
6.

Conference Proceedings

Conference Proceedings
Kim, S.-W. ; Lee, J.-H. ; Song, H.-S. ; Kim, J.-S. ; Lee, H.-W.
Pub. info.: Eco-materials processing & design : ISEPD-4, proceedings of the 4th International Symposium on Eco-Materials Processing & Design, Gyungpodae, Korea, February 4-6, 2003.  pp.125-130,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 439
7.

Conference Proceedings

Conference Proceedings
Kim, J.-J. ; Kim, J.-S.
Pub. info.: Linear and Nonlinear Optics of Organic Materials IV.  pp.141-151,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5517
8.

Conference Proceedings

Conference Proceedings
Joo, J.-D. ; Kim, J.-S. ; Morita, H. ; Ohmi, T.
Pub. info.: Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.280-288,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-35
9.

Conference Proceedings

Conference Proceedings
Kim, J.-S. ; Morita, H. ; Joo, J.-D. ; Ohmi, T.
Pub. info.: ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology.  pp.199-210,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-3
10.

Conference Proceedings

Conference Proceedings
Kim, J.-S. ; Jung, J.-C. ; Kong, K.-K. ; Kim, H.-R. ; Kim, H.-S.
Pub. info.: Advances in resist technology and processing XX.  2  pp.761-769,  2003.  Bellingham, CA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5039