1.

Conference Proceedings
Conference Proceedings
1. Very Light Nitridation Of Thin Gate Oxide In Low Pressure N20 Ambients
Joo, M.-S. ; Lee, S.-H. ; Cho, B.-J. ; Kim, J.-C. ; Choi, S.-H.
Pub. info.: Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.458-465,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-16
2.

Conference Proceedings
Conference Proceedings
2. Generation of realistic scene using illuminant estimation and mixed chromatic adaptation
Kim, J.-C. ; Hong, S.-G. ; Kim, D.-H. ; Park, J.-H.
Pub. info.: Color imaging IX : processing, hardcopy, and applications : 20-22 January 2004, San Jose, California, USA.  pp.481-489,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5293
3.

Conference Proceedings
Conference Proceedings
3. Mechanical Characteristics of Mg and its Composites Recycled from Mg Chips
Chang, S.-Y. ; Kim, J.-C. ; Ryu, S.K. ; Oh, S.-T. ; Kang, K.M.
Pub. info.: Eco-materials processing & design : ISEPD-4, proceedings of the 4th International Symposium on Eco-Materials Processing & Design, Gyungpodae, Korea, February 4-6, 2003.  pp.46-50,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 439
4.

Conference Proceedings
Conference Proceedings
4. Adaptive hierarchical stereo matching using object segmentation and window warping
Lee, H.-K. ; Kim, J.-C. ; Kim, Y.-T. ; Ha, Y.-H.
Pub. info.: Stereoscopic Displays and Virtual Reality Systems IX.  pp.358-366,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4660
5.

Conference Proceedings
Conference Proceedings
5. Aberration sensitivity control for the isolation layer in low-k1 DRAM process
Cho, B.-H. ; Yim, D. ; Park, C.-H. ; Lee, S.-H. ; Yang, H.-J. ; Choi, J.-H. ; Shin, Y.-C. ; Kim, C.-D. ; Choi, J.-S. ; Kang, K.-O. ; Kim, S.-W. ; Yu, T.-H. ; Hong, J. ; Kim, J.-C. ; Han, M.-S. ; Heo, H.-Y. ; Kim, Y.-D. ; Lee, D.-D. ; Yoon, G.-H. ; van schoot, J.B. ; Theeuwes, T. ; Min, Y.-H.
Pub. info.: Optical Microlithography XV.  Part Two  pp.831-839,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4691
6.

Conference Proceedings
Conference Proceedings
6. Digital TV image quality improvement considering distributions of edge characteristic
Hong, S.-G. ; Kim, J.-C. ; Park, J.-H.
Pub. info.: Image Quality and System Performance.  pp.239-246,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5294