1.

Conference Proceedings
Conference Proceedings
1. Wall-angle effects on the application of a scalar diffraction code to the channel data simulations in the high NA conditions
Shin, Y. S. ; Ahn, S. K. ; Lee, M. H. ; Kim, J. -Y.
Pub. info.: Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA.  pp.671-677,  2004.  Bellingham.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5380
2.

Conference Proceedings
Conference Proceedings
2. Chemically amplified resists based on acrylate polymers containing ketal groups in the side chains
Kim, J. -B. ; Park, J. -J. ; Jang, J. -H. ; Kim, J. -Y.
Pub. info.: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.625-632,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3678
3.

Conference Proceedings
Conference Proceedings
3. Easy and effective indexing and browsing schemes for digital photo album application [5909-22]
Kim, S. -K. ; Yang, S. ; Seo, K. ; Ro. Y. M. ; Kim, J. -Y.
Pub. info.: Applications of digital image processing XXVIII : 2-4 August 2005, San Diego, California, USA.  pp.59090M-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5909
4.

Conference Proceedings
Conference Proceedings
4. Process Integration of Highly Stable 1.25um2 6T-SRAM Cell with 45 nm Gate Length Triple Gate Transistors
Lee, K. ; Yang, J. -H. ; Maeda, S. ; Jin, Y.- S. ; Choi, J. -A. ; Bae, S. -G. ; Kim, Y. -H. ; Ahn, J. -H. ; Sun, M. -C. ; Ku, J. -H. ; Rhee, H. -S. ; You, Y. -S. ; Kim, J. -Y. ; Nam, B. -Y. ; Kang, C. -J.
Pub. info.: Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium.  pp.16-31,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-04
5.

Conference Proceedings
Conference Proceedings
5. Super-resolution using POCS-based reconstruction with artifact reduction constraints [5960-192]
Kim, J. -Y. ; Park, R. -H. ; Yang, S.
Pub. info.: Visual Communications and Image Processing 2005.  pp.1810-1818,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5960