1.

Conference Proceedings
Conference Proceedings
1. MICROELE CTRONICS AND MICROJOINING Selection of Proper Fatigue Model for Flip Chip Package Reliability
Shin, Y.E. ; Kim, Y.S. ; Kim, H.I. ; Kim, J.M. ; Chang, K.H. ; Parson, D.F.
Pub. info.: New frontiers of processing and engineering in advanced materials : proceedings of the International Conference on New Frontiers of Process Scinence and Engineering in Advanced Materials : The 14th Iketani Conference, November, 24-26, 2004, held in Kyoto, Japan.  pp.393-398,  2005.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 502
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Conference Proceedings
Conference Proceedings
2. Polyacrylic acid/poly(vinyl sulfonic acid, sodium salt) copolymer hydrogel actuator under an electric field
Park, S.J. ; Yoon, S.G. ; Kim, H.I. ; Shin, K.M. ; Kim, S.I. ; Kim, S.J.
Pub. info.: Smart structures and materials 2004 : electroactive polymer actuators and devices (EAPAD) : 15-18 March 2004, San Diego, California, USA.  pp.475-483,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5385
3.

Conference Proceedings
Conference Proceedings
3. Novel Chemistry for Surface Engineering in MEMS
Zhu, X.-Y. ; Jun, Y. ; Boiadjiev, V. ; Major, R. ; Kim, H.I. ; Houston, J.E.
Pub. info.: Materials science of microelectromechanical systems (MEMS) devices III : symposium held November 27-28, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 657
4.

Conference Proceedings
Conference Proceedings
4. Inductively Coupled Plasma Etching of Pb(ZrxTil-x)O3 Thin Films In Cl2C2F6 and HBr Plasmas
Chung, C.W. ; Byun, Y.H. ; Kim, H.I.
Pub. info.: Thin film materials, processes, and reliability : proceedings of the international symposium.  pp.63-68,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-24
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Conference Proceedings
Conference Proceedings
5. The study of contact hole MEEF and defect printability
Jeong, C.-Y. ; Lim, Y.H. ; Kim, H.I. ; Park, J.L. ; Choi, J.S. ; Lee, J.G.
Pub. info.: Optical Microlithography XVII.  pp.930-938,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377