1.

Conference Proceedings

Conference Proceedings
Song, K.H. ; Yoon, T.H. ; Hahn, S.R. ; Kim, E.T. ; Kwon, J.H. ; Lee, S.G. ; Hwang, T.S. ; Lee, Y.S. ; Kim, J.M.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.77-83,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
2.

Conference Proceedings

Conference Proceedings
Kim, E.T. ; Han, M.S. ; Kwon, J.H. ; Hahn, S.R. ; Song, K.H. ; Lee, S.G. ; Lee, T.S. ; Lee, Y.S. ; Kim, J.M.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.84-90,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
3.

Conference Proceedings

Conference Proceedings
Kim, T.H. ; Han, M.S. ; Jeoung, M.S. ; Kwon, J.H. ; Yim, N.S. ; Lee, G.S. ; Kim, E.T. ; Hahn, S.R. ; Kwon, H.C. ; Bin, Y. ; Jeoung, Y.T. ; Kim, J.M.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.91-97,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
4.

Conference Proceedings

Conference Proceedings
Ye, Zhengmao ; Campbell, Joe C. ; Chen, Zhonghui ; Baklenov, O. ; Kim, E.T. ; Mukhametzhanov, I. ; Tie, J. ; Madhukar, A.
Pub. info.: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.461-466,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 692
5.

Conference Proceedings

Conference Proceedings
Ye, Z. ; Campbell, J.C. ; Chen, Z. ; Kim, E.T. ; Madhukar, A.
Pub. info.: Quantum dot devices and computing : 21 January 2002, San Jose, USA.  pp.16-24,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4656