1.

Conference Proceedings
Conference Proceedings
1. Effects of Nitrogen on Preventing the Crystallization of Amorphous Ta-Si-N Diffusion Barrier
Kim, Dong Joon ; Jeong, Soon Pil ; Kim, Yong Tae ; Park, Jong-Wan
Pub. info.: Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A..  pp.331-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 472
2.

Conference Proceedings
Conference Proceedings
2. Reliability of Cu/WN Thin Films Deposited on Low-Dielectric Constant SiOF ILD
Lee, Seoghyeong ; Kim, Dong Joon ; Yang, Sung-Hoon ; Park, Jeongwon ; Sohn, Seil ; Oh, Kyunghui ; Kim, Yong-Tae ; Park, Jong-Wan
Pub. info.: Low-dielectric constant materials IV : symposium held April 14-16, 1998, San Francisco, California, U.S.A..  pp.347-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 511
3.

Conference Proceedings
Conference Proceedings
3. COMPARISON OF AMORPHOUS AND POLYCRYSTALLINE TUNGSTEN NITRIDE DIFFUSION BARRIER FOR MOCVD-Cu METALLIZATION
Kwon, Chul Soon ; Kim, Dong Joon ; Lee, Chang Woo ; Kim, Yong Tae ; Choi, In-Hoon
Pub. info.: Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA.  pp.441-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 355
4.

Conference Proceedings
Conference Proceedings
4. Effects of Boron on Diffusion Barrier Characteristics of PECVD W-B-N Films
Kim, Dong Joon ; Kim, Yong Tae ; Park, Jong-Wan
Pub. info.: Advanced interconnects and contact materials and processes for future integrated circuits : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.417-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 514
5.

Conference Proceedings
Conference Proceedings
5. Effects of Nitrogen on Preventing the Crystallization of Amorphous Ta-Si-N Diffusion Barrier
Kim, Dong Joon ; Jeong, Soon Pil ; Kim, Yong Tae ; Park, Jong-Wan
Pub. info.: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.247-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 473
6.

Conference Proceedings
Conference Proceedings
6. Growth and Characterization of InGaN/GaN LEDs on Corrugated Interface Substrate Using MOCVD
Kim, Sunwoon ; Oh, Jeong Tak ; Lee, Kyu Han ; Kim, Dong Joon ; Kim, Je Won ; Kim, Yong Chun ; Lee, Jeong Wook
Pub. info.: GaN, AIN, InN and their alloys : symposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A..  pp.215-220,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 831