1.

Conference Proceedings
Conference Proceedings
1. Scanning Rapid Thermal Annealing Process for Low Temperature Poly-Silicon Thin Film Transistors
Kim, F.-K. ; Kim, G.-B. ; Yoon, Y-G. ; Kim, C.-H. ; Lee, B.-I. ; Joo, S.-K.
Pub. info.: Advances in rapid thermal processing : proceedings of the symposium.  pp.285-290,  1999.  Pennington, N. J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-10
2.

Conference Proceedings
Conference Proceedings
2. Effects of NH3/N2 Plasma Treatment on Very-Low-Temperature (100℃) Oxides
Kim, C.-H. ; Jung, S-H. ; Nam, W.-J. ; Han, M.-K.
Pub. info.: Thin Film Transistor Technologies V : proceedings of the International Symposium.  pp.176-181,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-31
3.

Conference Proceedings
Conference Proceedings
3. Development of an Arc Sensor with Mechanized Rotation of Electrode
Kim, C.-H. ; Yoo, W-S. ; Na, S.-J.
Pub. info.: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.4135-4140,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 426-432
4.

Conference Proceedings
Conference Proceedings
4. A Comparative Study of the Photophysics in Polyfluorenes and Polyfluorenes With Polyphenylene Dendron Sidechains
List, E.J.W. ; Pogantsch, A. ; Wenzl, F.P. ; Kim, C.-H. ; Shinar, J. ; Loi, M.A. ; Bongiovanni, G. ; Mura, A. ; Setayesh, S. ; Grimsdale, A.C. ; Nothofer, H.G. ; Mullen, K. ; Scherf, U. ; Leising, G.
Pub. info.: Electronic, optical and optoelectronic polymers and oligomers : symposium held April 17-20, 2001, San Francisco, California, U.S.A.  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 665
5.

Conference Proceedings
Conference Proceedings
5. Process Stabilication of Blanket-W Plugging/ Interconnection Using RTP Treatment
Kim, C.-H. ; Hwang, S.-B. ; Yu, S.-H. ; Park, H.-L. ; Kim, C.-T.
Pub. info.: Proceedings of the Thirteenth International Symposium on Chemical Vapor Deposition.  pp.827-835,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-5
6.

Conference Proceedings
Conference Proceedings
6. Phase defect printability analysis for chromeless phase lithography technology
Huh, S. ; Park, J.H. ; Chung, D.-H. ; Kim, C.-H. ; Shin, I.-K. ; Choi, S.-W. ; Sohn, J.-M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.787-795,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
7.

Conference Proceedings
Conference Proceedings
7. Stereo sequence transmission via conventional transmission channel
Lee, H.-K. ; Kim, C.-H. ; Han, K.-P. ; Ha, Y.H.
Pub. info.: Image and Video Communications and Processing 2003.  2  pp.792-799,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5022
8.

Conference Proceedings
Conference Proceedings
8. Disparity space image-based stereo matching using optimal path searching
Kim, C.-H. ; Lee, H.-K. ; Ha, Y.-H.
Pub. info.: Image and Video Communications and Processing 2003.  2  pp.752-760,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5022
9.

Conference Proceedings
Conference Proceedings
9. Study of Cr patch validity for ArF CPL mask and its fabrication
Kim, C.-H. ; Kim, S.-H. ; Lee, M.-S. ; Park, J.-S. ; Shin, I.-G. ; Choi, S.-W. ; Yoon, H.-S. ; Han, W.-S.
Pub. info.: Optical Microlithography XVII.  pp.1247-1254,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377