Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. pp.264-269, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. pp.275-281, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. pp.254-256, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia. pp.244-253, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia. pp.274-277, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia. pp.290-291, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia. pp.260-263, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia. pp.245-251, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.757-760, 1998. Zuerich, Switzerland. Trans Tech Publications