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6 results

1.

Conference Proceedings

1. Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping

Yoganathan, M. ; Emorhokpor, E. ; Kerr, T. ; Gupta, A. ; Tanner, C.D. ; Zwieback, I.

Pub. info.:	Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.729-732, 2006. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	527-529

2.

Conference Proceedings

2. Growth of Large Diameter Semi-Insulating 6H-SiC Crystals by Physical Vapor Transport

Yoganathan, M. ; Gupta, A. ; Semenas, E. ; Emorhokpor, E. ; Martin, C. ; Kerr, T. ; Zwieback, I. ; Souzis, A.E. ; Anderson, T.A. ; Tanner, C.D. ; Chen, J. ; Barrett, D.L. ; Hopkins, R.H. ; Johnson, C.J. ; Yan, Fei ; Choyke, W.J. ; Devaty, R.P.

Pub. info.:	Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A.. pp.21-26, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	815

3.

Conference Proceedings

3. 6H and 4H-SiC Bulk Growth by PVT and Advanced PVT (APVT)

Gupta, A. ; Yoganathan, M. ; Semenas, E. ; Zwieback, I. ; Emorhokpor, E. ; Martin, C. ; Kerr, T. ; Souzis, A. ; Anderson, T. ; Chen, J. ; Tanner, C. ; Barrett, D. ; Hopkins, R. ; Johnson, C.

Pub. info.:	Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A.. pp.15-20, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	815

4.

Conference Proceedings

4. Characterization and Mapping of Crystal Defects in Silicon Carbide

Emorhokpor, E. ; Kerr, T. ; Zwieback, I. ; Elkington, W. ; Dudley, M. ; Anderson, T. ; Chen, J.

Pub. info.:	Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A.. pp.127-132, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	815

5.

Conference Proceedings

5. Advanced PVT Growth of 2 & 3-Inch Diameter 6H SiC Crystals

Anderson, T.A. ; Barrett, D.L. ; Chen, J. ; Elkington, W.T. ; Emorhokpor, E. ; Gupta, A. ; Johnson, C.J. ; Hopkins, R.H. ; Martin, C. ; Kerr, T. ; Semenas, E. ; Souzis, A.E. ; Tanner, C.D. ; Yoganathan, M. ; Zwieback, I.

Pub. info.:	Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003. pp.75-78, 2004. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	457-460

6.

Conference Proceedings

6. The UKIRT wide-field camera (WFCAM): commissioning and performance on the telescope [6269-35]

Hirst, P. ; Casali, M. ; Adamson, A. ; Ives, D. ; Kerr, T.

Pub. info.:	Ground-based and Airborne Instrumentation for Astronomy. pp.62690Y-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6269

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