1.

Conference Proceedings

Conference Proceedings
Magerle,R. ; Burchard,A. ; Kerle,T. ; Pfeiffer,W. ; Deicher,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1503-1508,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Burchard,A. ; Deicher,M. ; Forkel-Wirth,D. ; Freidinger,J. ; Kerle,T. ; Magerle,R. ; Pfeiffer,W. ; Prost,W. ; Wellmann,P. ; Winnacker,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.987-991,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201