1.

Conference Proceedings
Conference Proceedings
1. High-sensitivity (25-μm pitch) microbolometer FPAs
Murphy,D.F. ; Ray,M. ; Wyles,R. ; Asbrock,J.F. ; Lum,N.A. ; Kennedy,A. ; Wyles,J. ; Hewitt,C. ; Graham,G.E. ; Horikiri,T. ; Anderson,J.S. ; Bradley,D. ; Chin,R. ; Kostrzewa,T.
Pub. info.: Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA.  pp.147-159,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4454
2.

Conference Proceedings
Conference Proceedings
2. High-sensitivity (25-μm pitch) microbolometer FPAs and application development
Murphy,D.F. ; Ray,M. ; Wyles,R. ; Asbrock,J.F. ; Lum,N.A. ; Kennedy,A. ; Wyles,J. ; Hewitt,C. ; Graham,G.E. ; Radford,W.A. ; Anderson,J.S. ; Bradley,D. ; Chin,R. ; Kostrzewa,T.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.222-234,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
3.

Conference Proceedings
Conference Proceedings
3. Integrated imaging sensors
Anderson,J.S. ; Kostrzewa,T. ; Cook,L.G. ; Baker,G. ; Radford,W.A. ; Jack,M.D. ; Finch,A. ; Kennedy,A. ; Kojiro,J.K. ; Murphy,D.F. ; Ray,M. ; Wyles,R. ; Lohrmann,D. ; Williams,G. ; Janesick,J. ; Dosluoglu,T. ; Reinheimer,A.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.14-24,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
4.

Conference Proceedings
Conference Proceedings
4. Low-cost microsensors program
Anderson,J.S. ; Bradley,D. ; Chen,C.W. ; Chin,R. ; Jurgelewicz,K. ; Radford,W.A. ; Kennedy,A. ; Murphy,D.F. ; Ray,M. ; Wyles,R. ; Brown,J.C. ; Newsome,G.W.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.559-565,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
5.

Conference Proceedings
Conference Proceedings
5. Sensitivity improvements in uncooled microbolometer FPAs
Radford,W.A. ; Murphy,D.F. ; Finch,J.A. ; Hay,K. ; Kennedy,A. ; Ray,M. ; Sayed,A.A. ; Wyles,J. ; Wyles,R. ; Varesi,J. ; Moody,E.A. ; Cheung,F.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.119-130,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
6.

Conference Proceedings
Conference Proceedings
6. Microbolometer uncooled infrared camera with 20-mK NETD
Radford,W.A. ; Murphy,D.F. ; Finch,A. ; Kennedy,A. ; Kojiro,J.K. ; Ray,M. ; Wyles,R. ; Coda,R. ; Moody,E.A. ; Baur,S.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.22-35,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
7.

Conference Proceedings
Conference Proceedings
7. Low-Cost Microsensors Program
Anderson,J.S. ; Bradley,D. ; Chin,R. ; Radford,W.A. ; Kennedy,A. ; Murphy,D.F. ; Ray,M. ; Wyles,R. ; Brown,J.C. ; Newsome,G.W.
Pub. info.: Unattended ground sensor technologies and applications II : 26 April 2000, Orlando, [Florida] USA.  pp.31-36,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4040
8.

Conference Proceedings
Conference Proceedings
8. Remote and On-Board Instrumentation for Automotive Emisions Monitoring
Jack,M.D. ; Ahlgren,W. ; Bahan,T.P. ; Gray,M.N. ; Hanson,J.L. ; Heidt,T.L. ; Huerta,F.A. ; Kennedy,A. ; Nelson,D.R. ; Paneral,A.J. ; Peterson,C.M. ; Peterson,J. ; Sullivan,M. ; Pham,K. ; Rubin,L.H. ; Tacelli,C.B. ; Trautfield,W.C. ; Wageneck,R.O. ; Walter,G.A.
Pub. info.: Optical remote sensing for environmental and process monitoring : proceedings of a symposium sponsored by the Air & Waste Management Association, San Francisco, CA, September 25-27, 1995.  pp.3-14,  1996.  Pittsburgh, Penn..  Air & Waste Management Association
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2883
9.

Conference Proceedings
Conference Proceedings
9. 320｡ﾟ240 silicon microbolometer uncooled IR FPAs with on-chip offset correction
Radford,W.A. ; Murphy,D. ; Ray,M. ; Propst,S.H. ; Kennedy,A. ; Kojiro,J.K. ; Woolaway,J.T. ; Soch,K.L. ; Coda,R. ; Lung,G. ; Moody,E.A. ; Gleichman,D. ; Baur,S.
Pub. info.: Infrared Detectors and Focal Plane Arrays IV : 10-11 April 1996, Orlando, Florida.  pp.82-92,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2746
10.

Conference Proceedings
Conference Proceedings
10. 320｡ﾟ240 microbolometer focal plane array for uncooled applications
Radford,W.A. ; Murphy,D. ; Ray,M. ; Propst,S.H. ; Kennedy,A. ; Soch,K.L. ; Coda,R. ; Lung,G. ; Moody,E.A. ; Gleichman,D.
Pub. info.: Photodetectors : materials and devices : 1-2 February 1996.  pp.80-90,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2685