1.

Conference Proceedings
Conference Proceedings
1. SELECTIVE GATE RECESSING OF GaAs/AlGaAs/InGaAs PSEUDOMORPHIC HEMT STRUCTURES USING BCl3 PLASMAS
Kazior, T. E. ; Patel, B. I.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.329-334,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
2.

Conference Proceedings
Conference Proceedings
2. THE EFFECT OF RAPID THERMAL ANNEALING ON THE ELECTRICAL AND MATERIAL CHARACTERISTICS OF PLANAR DOPED AND UNIFORMLY DOPED GaAs/AlGaAs/InGaAs PSEUDOMORPHIC HEMT STRUCTURES
Kazior, T. E. ; Brierlev, S. K.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.557-562,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
3.

Conference Proceedings
Conference Proceedings
3. Pd-Ge-Au OHMIC CONTACTS TO GaAs: RELIABILITY AND FAILURE ANALYSIS
Kazior, T. E. ; Hieslmair, H. ; Brooks, R. C.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.313-318,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181
4.

Conference Proceedings
Conference Proceedings
4. RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs
Jackson, G. S. ; Tong, E. ; Saledas, P. ; Kazior, T. E. ; Sprague, R. ; Brooks, R. C. ; Hsieh, K. C.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.289-294,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181
5.

Conference Proceedings
Conference Proceedings
5. Pd-Ge-Au OHMIC CONTACTS TO GaAs: RELIABILITY AND FAILURE ANALYSIS
Kazior, T. E. ; Hieslmair, H. ; Brooks, R. C.
Pub. info.: Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A..  pp.249-254,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 184
6.

Conference Proceedings
Conference Proceedings
6. RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs
Jackson, G. S. ; Tong, E. ; Saledas, P. ; Kazior, T. E. ; Sprague, R. ; Brooks, R. C. ; Hsieh, K. C.
Pub. info.: Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A..  pp.225-230,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 184
7.

Conference Proceedings
Conference Proceedings
7. REACTIVE ION BEAM ASSISTED EVAPORATION OF TIN FILMS FOR USE AS DIFFUSION BARRIERS IN GaAs MMICs
Kazior, T. E. ; Brooks, R. C.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.511-516,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181