1.

Conference Proceedings
Conference Proceedings
1. TWO-DIMENSIONAL STRUCTURE OF REACTIVE SILANE PLASMAS IN THE PRESENCE OF CROSSED MAANETIC AND ELECTRIC FIELDS
Fujiyama. Hiroshi ; Kawasaki, H. ; Matsuda, Y. ; Ohno, N.
Pub. info.: Plasma processing and synthesis of materials III : symposium held April 17-19, 1990, San Francisco, California, U.S.A..  pp.161-168,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 190
2.

Conference Proceedings
Conference Proceedings
2. A comparative study of stratospheric temperatures between ILAS-II and other data
Sugita, T. ; Yakota, T. ; Nakajima, H. ; Kobayashi, H. ; Saitoh, N. ; Kawasaki, H. ; Usami, M. ; Soeki, H. ; Horikawa, M. ; Sasano, Y.
Pub. info.: Passive optical remote sensing of the atmosphere and clouds IV : 9-10 November 2004, Honolulu, Hawaii, USA.  pp.279-289,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5652
3.

Conference Proceedings
Conference Proceedings
3. Thermal Stress Characteristics and Void Formation in Al(Cu) Interconnects
Ho, P.S. ; Yeo, I.-s. ; Jawarani, D. ; Anderson, S.G. ; Kawasaki, H.
Pub. info.: Proceedings of the Symposium on Reliability of Metals in Electronics.  pp.106-115,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-3
4.

Conference Proceedings
Conference Proceedings
4. The Effect of Test Structure and Stress Condition on Electromigration Failure
Kawasaki, H. ; Lee, C. ; Pintchovski, F.
Pub. info.: Proceedings of the Symposium on Reliability of Metals in Electronics.  pp.165-177,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-3
5.

Conference Proceedings
Conference Proceedings
5. Electromigration Failure Modes in CU Metallization*
Gall, M. ; Capasso, C. ; Thrasher, S. ; Zhao, L. ; Muiski, P. ; Hernandez, R. ; Herrick, M. ; Angyal, M. ; Boeck, B. ; Kawasaki, H.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.410-425,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-2
6.

Conference Proceedings
Conference Proceedings
6. Diffusional Void Growth in Dual-Inlaid Cu Interconnects
Jawarani, D. ; Gall, M. ; Capasso, C. ; Clark, G. ; Hernandez, R. ; Kawasaki, H.
Pub. info.: Interconnect and contact metallization for ULSI : proceedings of the international symposium.  pp.198-205,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-31
7.

Conference Proceedings
Conference Proceedings
7. TDDB Reliability Assessment and Burn-in for Thin Gate Oxides
Anderson, S. ; Moosa, M. ; Fowler, T. ; Kawasaki, H.
Pub. info.: Proceedings of the Symposium on Interconnect and Contact Metallization.  pp.218-227,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-31
8.

Conference Proceedings
Conference Proceedings
8. Statistical Modeling and Experimental Verification of Electromigration Time to Fail Distribution in Metal Interconnects
Capasso, C. ; Gall, M. ; Anderson, S. ; Jawarani, D. ; Hernandez, R. ; Kawasaki, H.
Pub. info.: Proceedings of the Symposium on Interconnect and Contact Metallization.  pp.196-202,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-31
9.

Conference Proceedings
Conference Proceedings
9. A Comparative Study on Electromigration Failure Mechanism Between Near-Bamboo and Bamboo Al(Cu) Two-Level Structure
Wang, P.-H. ; Lee, C. ; Jawarani, D. ; Kawasaki, H. ; Ho, P. S.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.265-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
10.

Conference Proceedings
Conference Proceedings
10. Critical Length and Resistance Saturation Effects in Al(Cu) Interconnects
Gall,M. ; Muller, J. ; Jawarani, D. ; Capasso, C. ; Hernanndez, R. ; Kawasaki, H.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.231-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516