1.

Conference Proceedings

Conference Proceedings
Baeumler, M. ; Kaufmann, U. ; Windscheif, J.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.201-206,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
2.

Conference Proceedings

Conference Proceedings
Behr, D. ; Niebuhr, R. ; Obloh, H. ; Wagner, J. ; Bachem, K. H. ; Kaufmann, U.
Pub. info.: Gallium nitride and related materials II : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.213-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 468
3.

Conference Proceedings

Conference Proceedings
Kaufmann, U. ; Kunzer, M. ; Merz, C. ; Akasaki, I. ; Amano, H.,
Pub. info.: Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.633-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 395
4.

Conference Proceedings

Conference Proceedings
Niebuhr, R. ; Bachem, K. H. ; Behr, D. ; Hoffmann, C. ; Kaufmann, U. ; Lu, Y. ; Santic, B. ; Wagner, J. ; Arlery, M. ; Rouviere, J. L. ; Jurgensen, H.
Pub. info.: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.769-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 449
5.

Conference Proceedings

Conference Proceedings
Wagner, J. ; Kaufmann, U. ; Koehler, K. ; Kunzer, M. ; Pletschen, W. ; Obloh, H. ; Schlotter, P. ; Stephan, T. ; Walcher, H. ; Ellens, A. ; Rossner, W. ; Kobusch, M.
Pub. info.: Light-Emitting Diodes: Research, Manufacturing, and Applications VI.  pp.50-59,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4641