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14 results

Conference Proceedings

1. *ENHANCED BAND-GAP LUMINESCENCE IN STRAIN-SYMMETRIZED (Si)m(Ge)n SUPERLATTICES

Menczigar, U. ; Abstreiter, G. ; Kibbel, H. ; Presting, H. ; Kasper, E.

Pub. info.:	Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.. pp.33-44, 1993. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	298

Conference Proceedings

2. X-RAY INVESTIGATION OF STRAIN RELAXATION IN SHORT-PERIOD SimGen SUPERLATTICES USING RECIPROCAL SPACE MAPPING

Hamberger, P. ; Koppensteiner, E. ; Bauer, G. ; Kibbel, H. ; Presting, H. ; Kasper, E. ; Pesek, A.

Pub. info.:	Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.. pp.27-32, 1993. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	298

Conference Proceedings

3. SILICON GERMANIUM HETEROBIPOLAR TRANSISTOR STRUCTURES WITH EXTREMELY HIGH BASE DOPING

Kasper, E. ; Kibbel, H. ; Konig, U.

Pub. info.:	Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A.. pp.451-456, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	220

Conference Proceedings

4. ELECTRO- AND PHOTOLUMINESCENCE FROM ULTRATHIN SimGen SUPERLATICES

Presting, H. ; Menczigar, U. ; Abstreiter, G. ; Kibbel, H. ; Kasper, E.

Pub. info.:	Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A.. pp.83-88, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	256

Conference Proceedings

5. PHOTOLUMINESCENCE INVESTIGATIONS OF HIGH PURITY MBE-GROWN Si1-xGeX/Si SINGLE QUANTUM WELLS

Wachter, M. ; Schaffler, F. ; Thonke, K. ; Sauer, R. ; Herzog, H.-J. ; Kasper, E.

Pub. info.:	Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.. pp.85-90, 1993. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	298

Conference Proceedings

6. STRAIN MEASUREMENTS IN Si/Si0.5Ge0.5 SUPERLATTICES BY He ION CHANNELING

Mantl, S. ; Kasper, E. ; Jorke, H. J.

Pub. info.:	Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.. pp.305-310, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	91

Conference Proceedings

7. CHARACTERIZATION AND OPTICAL STUDIES OF SHORT-PERIOD SimGem SUPERLATTICES

Presting, H. ; Kibbel, H. ; Kasper, E. ; Grimmeiss, H.G. ; Hagesh, V.G.

Pub. info.:	Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A.. pp.327-332, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	220

Conference Proceedings

8. EQUALLY STRAINED Si/SiGe SUPERLATTICES ON Si SUBSTRATES

Kasper, E. ; Herzog, H.-J. ; Daembkes, H. ; Abstreiter G.

Pub. info.:	Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.347-358, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	56

Conference Proceedings

9. Silicon Germanium Trends on Process Integration*

Kasper, E.

Pub. info.:	ULSI Process Integration : proceedings of the International Symposium. pp.143-154, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-2

10.

Conference Proceedings

10. Silicon MM- Wave Integrated Circuits (SIMMWIC)

Kasper, E. ; Zhao, W.

Pub. info.:	Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001). VOL-2 pp.763-770, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4746

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Author: Kasper, E.