1.

Conference Proceedings
Conference Proceedings
1. Noninvasive electrical characterization of semisonductor and interface
Kasouit, S. ; Drevillon, B. ; Conde, J. ; Kim, H.J. ; Kleider, J.P. ; Vanderhaghen, R.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.213-220,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
2.

Conference Proceedings
Conference Proceedings
2. Low-temperature plasma-deposited microcrystalline silicon thin films: an emerging material for stable thin film transistors
Cabarrocas, P.R. ; Kasouit, S. ; Kalache, B. ; Vanderhaghen, R. ; Bonnassieux, Y. ; Elyaakoubi, M. ; French, I.D.
Pub. info.: Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas.  pp.84-94,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5004
3.

Conference Proceedings
Conference Proceedings
3. Noninvasive electrical characterization of semiconductor at bulk and interfaces (Invited Paper)
Vanderhaghen, R. ; Kasouit, S. ; Drevillon, B. ; Chu, V. ; Conde, J. ; Kim, H. ; Kleider, J.P.
Pub. info.: Quantum Sensing: Evolution and Revolution from Past to Future.  pp.261-278,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4999