1.

Conference Proceedings
Conference Proceedings
1. Providing technology infrastructure for MEMS
Ribas,R.P. ; Veychard,D. ; Karam,J.M. ; Courtois,B.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part1  pp.298-305,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
2.

Conference Proceedings
Conference Proceedings
2. Advanced integrated solution for MEMS design
Liateni,K. ; Moulinier,D. ; Affour,B. ; Boutamine,H. ; Karam,J.M. ; Veychard,D. ; Courtois,B. ; Cao,A.D.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part1  pp.161-170,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
3.

Conference Proceedings
Conference Proceedings
3. Design of an APS CMOS image sensor for space applications using standard CAD tools and CMOS technology
Goy,J. ; Courtois,B. ; Karam,J.M. ; Pressecq,F.
Pub. info.: Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France.  pp.145-152,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4019
4.

Conference Proceedings
Conference Proceedings
4. Moving from analysis to design:a MEMS CAD tool evolution
Liateni,K. ; Lee,H.J. ; Maher,M.A. ; Karam,J.M.
Pub. info.: Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France.  pp.188-192,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4019
5.

Conference Proceedings
Conference Proceedings
5. Design and test of an active pixel sensor （APS) for space applications
Goy,J. ; Courtois,B. ; Karam,J.M.
Pub. info.: Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA.  pp.93-99,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4306
6.

Conference Proceedings
Conference Proceedings
6. Integrated mixedtechnology design environment to support micro-electro-mechanical systems development
Karam,J.M. ; Courtois,B. ; Cao,A.D. ; Hofmann,K.
Pub. info.: Micromachined Devices and Components IV.  pp.278-286,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3514
7.

Conference Proceedings
Conference Proceedings
7. Engineering tool set for monolithic and hybrid microsystem design
Boutamine,H. ; Karam,J.M. ; Courtois,B. ; Drake,P. ; Oudinot,J. ; El Tahawi,H. ; Cao,A. ; Rencz,M. ; Poppe,A. ; Szekely,V.
Pub. info.: Microlithography and Metrology in Micromachining III.  pp.76-84,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3225
8.

Conference Proceedings
Conference Proceedings
8. MEMS CAD and foundries: where are we going? (Invited Paper)
Karam,J.M.
Pub. info.: Micromachined Devices and Components III.  pp.232-237,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3224