Hwang, D.M. ; Ravi, T.S. ; Bhat, R. ; Simhony, S. ; Chen, C.Y. ; Kapon, E.
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Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.719-724, 1991. Pittsburgh, Pa.. Materials Research Society
Hwang, D.M. ; Kapon, E. ; Tamargo, M.C. ; Bhat, R.
Pub. info.:
Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A.. pp.773-778, 1987. Pittsburgh, Pa.. Materials Research Society
Hwang, D. M. ; Kapon, E. ; Tamargo, M. C. ; Harbison, J. P. ; Bhat, R. ; Nazar, L.
Pub. info.:
Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.. pp.209-214, 1988. Pittsburgh, Pa.. Materials Research Society
Utke, I. ; Cicoira, F. ; Jaenchen, G. ; Hoffmann, P. ; Scandella, L. ; Dwir, B. ; Kapon, E. ; Laub, D. ; Buffat, Ph. ; Xanthopoulos, N. ; Mathieu, H.J.
Pub. info.:
Making functional materials with nanotubes : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.307-312, 2002. Warrendale, PA. Materials Research Society
Hoffmann, P. ; Utke, I. ; Cicoira, F. ; Dwir, B. ; Leifer, K. ; Kapon, E. ; Doppelt, P.
Pub. info.:
Materials development for direct write technologies : symposium held April 24-26, 2000, San Francisco, California, U.S.A.. pp.171-180, 2001. Warrendale, Pa.. Materials Research Society
Gustafson, A. ; Kapon, E. ; Bonard, J.M. ; Samuelson, L. ; Petersson, A. ; Nilsson, S.
Pub. info.:
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII). pp.71-83, 1995. Pennington, NJ. Electrochemical Society
Syrbu, A. ; Iakovlev, V. ; Suruceanu, G. ; Caliman, A. ; Mereuta, A. ; Mircea, A. ; Berseth, C.-A. ; Deichsel, E. ; Boucart, J. ; Rudra, A. ; Kapon, E.
Pub. info.:
Vertical-Cavity Surface-Emitting Lasers IX. pp.167-174, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering